- test switch circuit
- Техника: цепь диагностического переключателя
Универсальный англо-русский словарь. Академик.ру. 2011.
test switch circuit
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Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
Test light — Neon test lamp for line voltages A test light, test lamp, voltage tester, or mains tester is a very simple piece of electronic test equipment used to determine the presence or absence of an electric voltage in a piece of equipment under test.… … Wikipedia
Circuit de Monaco — Coordinates: 43°44′5″N 7°25′14″E / 43.73472°N 7.42056°E / 43.73472; 7.42056 … Wikipedia
RF Switch Matrix — or Microwave Switch Matrix or Switch Matrix An RF/Microwave Switch Matrix is used in test systems, in both design verification and manufacturing test, to route high frequency signals between the device under test (DUT) and the test and… … Wikipedia
1ESS switch — The Number One Electronic Switching System, the first large scale Stored Program Control (SPC) telephone exchange or Electronic Switching System in the Bell System, was introduced in Succasunna, New Jersey, in May 1965[1]. The switching fabric… … Wikipedia
Nonblocking minimal spanning switch — A substitute for a 16x16 crossbar switch made from 12 4x4 crossbar switches. A nonblocking minimal spanning switch is a device that can connect N inputs to N outputs in any combination. The most familiar use of switches of this type is in a… … Wikipedia
Printed circuit board — Part of a 1983 Sinclair ZX Spectrum computer board; a populated PCB, showing the conductive traces, vias (the through hole paths to the other surface), and some mounted electrical components A printed circuit board, or PCB, is used to… … Wikipedia
Panel switch — The panel switching system was an early type of automatic telephone exchange, first put into urban service by the Bell System in the 1920s and removed during the 1970s. The Panel and Rotary systems were developed in parallel by Bell Labs before… … Wikipedia
Automatic test pattern generation — ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables testers… … Wikipedia
Silverstone Circuit — Home of British Motor Racing [1] Silverstone Circuit – 2010 Onwards Location … Wikipedia
Integrated circuit — Silicon chip redirects here. For the electronics magazine, see Silicon Chip. Integrated circuit from an EPROM memory microchip showing the memory blocks, the supporting circuitry and the fine silver wires which connect the integrated circuit die… … Wikipedia
